Yokogawa GS820 Multi-channel Signal Source Measurement Unit[USED]

$1,000.00
Yokogawa GS820 Multi-channel Signal Source Measurement Unit[USED]

Yokogawa GS820 Multi-channel Signal Source Measurement Unit[USED]

$1,000.00

Description

Yokogawa GS820 is a high‑precision, multi‑channel source measure unit (SMU) with two fully isolated analog channels, supporting four‑quadrant operation and high‑speed, programmable sourcing/measurement for electronic component and device testingYokogawa Test & Measurement.

Core Specifications (18V / 50V Models)

表格
Parameter 18V Model 50V Model
Channels 2 isolated analog channelsYokogawa Test & Measurement 2 isolated analog channelsYokogawa Test & Measurement
Voltage Ranges ±200 mV, ±2 V, ±7 V, ±18 V ±200 mV, ±2 V, ±20 V, ±50 V
Current Ranges ±200 nA to ±3.2 A ±200 nA to ±1.2 A
Max Output ±7 V / ±3.2 A; ±18 V / ±1.2 A ±20 V / ±1.2 A; ±50 V / ±0.6 A
Resolution 5.5 digits; 1 pA / 10 nV 5.5 digits; 1 pA / 10 nV
Operation Four‑quadrant (source/sink)Yokogawa Test & Measurement Four‑quadrant (source/sink)Yokogawa Test & Measurement
Arbitrary Waveform Up to 100,000 points; 100 μs step Up to 100,000 points; 100 μs step
Sense Local / 4‑wire remote sense Local / 4‑wire remote sense
Digital I/O 16‑bit (765602/765612) 16‑bit (765602/765612)
Interfaces USB, LAN (Ethernet)web-material3.yokogawa.com USB, LAN (Ethernet)web-material3.yokogawa.com
Dimensions 213 W × 88 H × 379 D mm 213 W × 88 H × 379 D mm
Weight ~5 kg ~5 kg

Key Functions per Channel

  • VS/IM: Voltage source + current measurement
  • IS/VM: Current source + voltage measurement
  • VS: Voltage source only
  • IS: Current source only
  • VM: Voltmeter only
  • IM: Ammeter only
  • Resistance: Measure via IS/VMYokogawa Test & Measurement

Key Features

  • Isolated Channels: Full galvanic isolation between channels and groundYokogawa Test & Measurement.
  • High Speed: Simultaneous dual‑channel measurement; fast data transfer via USB/LANweb-material3.yokogawa.com.
  • Master‑Slave Expansion: Up to 10 channels total (5 units) with full synchronizationYokogawa Test & Measurement.
  • Programmable: CSV‑based test sequences; no‑PC standalone operationYokogawa Test & Measurement.
  • Low Noise: Ultra‑low noise for precision low‑level testing.

Typical Applications

  • Semiconductor device characterization (diodes, transistors, ICs)
  • LED and optoelectronic component testing
  • Battery and power supply evaluation
  • Automated production line testing (ATE)
  • I‑V curve tracing and resistance measurement